Electrical & Computer Engineering
Provides full-image access to the publications of both the Institute of Electrical and Electronics Engineers (IEEE) and the Institution of Electrical Engineers (IEE); includes all journals, magazines, standards and conference proceedings published since 1988.The index is a subset of the INSPEC database, allowing users to search specifically for the information they need, then display and print the full image. Each image includes all charts, graphs, diagrams, photographs, and illustrative material.
Coverage: 1896-present. Indexes and abstracts serials, conference proceedings, standards and reports in the physical sciences, electrical engineering & computer science.
This site provides access to ACM journals and magazines, as well as conference proceedings.
The Derwent Innovations Index, available through the ISI Web of Knowledge interface, is a Web-accessible product that merges the Derwent World Patents Index with the Derwent Patents Citation Index. It provides access to more than 14,800,000 patents with links to cited and citing patents, cited articles, and full-text patent data sources. This resource gives users a comprehensive and international overview of inventions in three categories: chemical, electrical and electronic, and engineering. (Learn More)
Includes full-text up to date standards from the American Society for Testing and Materials, Underwriters Laboratories, and International Telecommunication Union. Note: IHS Standards users are now required to access the IHS platform through a registered account. See Available Standards.
- ASEE Annual conference proceedings - (description)
- Compendex - (description)
- Electronics and communications abstracts (Bethesda, Md.) (Article Database) - (description)
- Science citation index expanded - (description)
- Solid state and superconductivity abstracts - (description)
- SPIE digital library - (description)
- techXtra - (description)
- ThomasNet - (description)