2000 journal article

SiC MISFETs with MBE-grown AlN gate dielectric

Materials Science Forum, 338(3), 1315–1318.

By: C. Zetterling, M. Ostling, H. Yano, T. Kimoto, H. Matsunami, K. Linthicum, R. Davis

Source: NC State University Libraries
Added: August 6, 2018