Databases: IEEE Xplore

IEEE Xplore

Provides full-image access to the publications of both the Institute of Electrical and Electronics Engineers (IEEE) and the Institution of Electrical Engineers (IEE); includes all journals, magazines, standards and conference proceedings published since 1988.The index is a subset of the INSPEC database, allowing users to search specifically for the information they need, then display and print the full image. Each image includes all charts, graphs, diagrams, photographs, and illustrative material.